Ultra-fine probe supports 0.15–0.3mm tiny pitch, designed for FPD, WLCSP and micro-packaged chips. Precise structure ensures stable contact in ultra-fine circuits.
Features:
Kelvin probe uses 4-wire measurement in pairs to eliminate lead resistance. It ensures high-precision test for resistance, voltage and small signals, ideal for power & analog ICs.
Features:
High-frequency test probe is designed for semiconductor high-speed & RF testing. Optimized structure ensures low resistance, stable signal, and long life for 0.30–1.27mm pitch applications.
Features: